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TAC Chair: Ian G. Harris, University of California Irvine
The purpose of this Technical Activity Committee is to provide a focal
point for ongoing research in the area of System Test. To this end, we
perform the following tasks:
- Encourage research in System Test by sponsoring activities at
conferences and workshops.
- Provide an archive of information on System Test research.
The term "System Test" is used to describe the process of testing and
validating the composition of heterogeneous components. In spite of
the wide variety of system design and test styles, a number of
research themes have been identified which are central to the field of
system test. Please see the System Test
Tutorial for an overview of the field of System Test.
Upcoming System Test Events:
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Special Issue on
Covalidation of Embedded Hardware/Software Systems
Design Automation for Embedded Systems, A Kluwer International Journal
Guest Editor: Ian G. Harris, University of Massachusetts Amherst
The widespread use of embedded systems in cost-critical and
life-critical applications has motivated the need for systematic
approaches to verifying functionality. The investigation for solutions
to verification has led to the increased importance of the
hardware/software covalidation problem because the vast majority of
embedded systems are built from both hardware and software
components. Covalidation employs simulation techniques to verify
system design correctness early in the design cycle. Simulation-based
approaches in general are far more popular than formal techniques in
practice because simulation is tractable for large designs, and
specification of formal properties is difficult for most designers. A
significant difficulty in the covalidation of hardware/software
systems has been the wide gap between the hardware and the software
research communities. This special issue will serve to bring these two
communities closer together to examine a common problem.
Important Dates: |
Submission of abstracts | 1/31/03 |
Submission of manuscripts | 2/14/03 |
Notification of paper acceptance | 4/14/03 |
Submission of final manuscripts | 6/6/03 |
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International Test Conference
Special Call for Papers:
Board and System Test
In 2003, International Test Conference-the world's premier conference
dedicated to the electronic test of devices, boards and systems- will
feature an expanded focus on board and system test, and therefore
issues this special call-for-papers for a board and system test
practitioner track. Papers on mainstream board and system test topics
are being solicited for presentation. In order to allow this track
time to develop, these papers, though subject to the usual ITC
standards and guidelines, will have an extended submission deadline of
June 6, 2003.
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